A2
2016 Detlef Diesing and Eckart Hasselbrink  
Chemical energy dissipation at surfaces under UHV and high pressure conditions studied using metal–insulator–metal and similar devices
Chem. Soc. Rev. 45, 3747 (2016)
DOI: 10.1039/c5cs00932d
2014 Kevin Stella, Steffen Franzka, Damian Bürstel, Detlef Diesing, Dirk Mayer and Vladimir Roddatis  
Electrochemical oxidation as vertical structuring tool for ultrathin (d < 10 nm) valve metal films
ECS J. Solid State Sci. Technol. 3, P143 (2014)
DOI: 10.1149/2.013405jss
Jan Philipp Meyburg, Ievgen I. Nedrygailov, Eckart Hasselbrink and Detlef Diesing  
Thermal desorption spectroscopy from the surfaces of metal-oxide-semiconductor nanostructures
Rev. Sci. Instrum. 85, 104102 (2014)
DOI: 10.1063/1.4896979
Michael Scheele, Ievgen I. Nedrygailov, Eckart Hasselbrink and Detlef Diesing  
Energy transfer in argon atom - surface interactions studied by Pt-SiO2-Si thin film chemoelectronic devices
Vacuum 111, 137 (2014)
DOI: 10.1016/j.vacuum.2014.09.017
2013 Ievgen I. Nedrygailov, Eduard G. Karpov, Eckart Hasselbrink and Detlef Diesing  
On the significance of thermoelectric and thermionic emission currents induced by chemical reactions catalyzed on nanofilm metal-semiconductor heterostructures
J. Vac. Sci. Technol. A 31, 021101 (2013)
DOI: 10.1116/1.4774217
S. Hanke, A. Duvenbeck, C. Heuser, B. Weidtmann, D. Diesing, M. Marpe and A. Wucher  
Computer simulation of internal electron emission in ion-bombarded metals
Nucl. Instrum. Methods B 303, 55 (2013)
DOI: 10.1016/j.nimb.2012.12.023
Beate Schindler, Detlef Diesing and Eckart Hasselbrink  
Electronically non-adiabatic processes in the interaction of H with a Au surface revealed using MIM junctions: The temperature dependence
J. Phys. Chem. C 117, 6337 (2013)
DOI: 10.1021/jp4009459
Beate Schindler, Detlef Diesing and Eckart Hasselbrink  
Electronic excitations in the course of the reaction of H with coinage and noble metal surfaces: A comparison
Z. Phys. Chem. 227, 1381 (2013)
DOI: 10.1524/zpch.2013.0408
M. A. Hashemian, E. Palacios, I. I. Nedrygailov, D. Diesing and E. G. Karpov  
Thermal properties of the stationary current in mesoporous Pt/TiO2 structures in an oxyhydrogen atmosphere
ACS Appl. Mater. Interfaces 5, 12375 (2013)
DOI: 0.1021/am403182v
2012 I.I. Nedrygailov, E. Hasselbrink, D. Diesing, S.K. Dasari, M.A. Hashemian and E.G. Karpov  
Non-invasive measurement ad control of the temperature of Pt nanofilms on Si supports
J. Vac. Sci. Technol. A 30, 030601 (2012)
DOI: 10.1116/1.3696973
Damian Bürstel and Detlef Diesing  
Electrochemically induced charge transfer in platinum–silicon heterosystems
Phys. Stat. Sol. A 209, 805 (2012)
DOI: 10.1002/pssa.201100616
D. Differt, W. Pfeiffer and D. Diesing  
Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms
Appl. Phys. Lett. 101, 111608 (2012)
DOI: 10.1063/1.4752734
M.L. Cummings, Y.T. Chien, C. Preissner, V. Madhavan, D. Diesing, M. Bode, J. W. Freeland and V. Rose  
Combining scanning tunneling microscopy and synchrotron radiation for high-resolution imaging and spectroscopy with chemical, electronic, and magnetic contrast
Ultramicroscopy 11, 22 (2012)
DOI: 10.1016/j.ultramic.2011.09.018
2011 Beate Schindler, Detlef Diesing and Eckart Hasselbrink  
Electronic excitations induced by hydrogen surface chemical reactions on gold
J. Chem. Phys.134, 034705 (2011)
DOI: 10.1063/1.3523647
Mario Marpe, Christian Heuser, Detlef Diesing and Andreas Wucher  
Internal electron emission in metal-insulator-metal thin film tunnel devices bombarded with keV argon and gold-cluster projectiles
Nucl. Instrum. Methods B 269, 972 (2011)
DOI: 10.1016/j.nimb.2010.12.045
Kevin Stella, Domocos A. Kovács, Wolfgang Brezna, Jürgen Smoliner and Detlef Diesing  
Charge transport through thin amorphous titanium and tantalum oxide layers
J. Electrochem. Soc. 158, P65 (2011)
DOI: 10.1149/1.3566194
Kevin Stella, Damian Bürstel, Eckart Hasselbrink and Detlef Diesing  
Thin tantalum films on crystalline silicon – a metallic glass
phys. stat. solidi (RRL) 5, 68 (2011)
DOI: 10.1002/pssr.201004510
Detlef Diesing, Domocos Kovács, Kevin Stella and Christian Heuser  
Characterization of atom and ion-induced ”internal” electron emission by thin film tunnel junctions
Nucl. Instrum. Methods B 269, 1185 (2011)
DOI: 10.1016/j.nimb.2010.12.034
C. Heuser, M. Marpe, D. Diesing and A. Wucher  
The possible role of anisotropy in kinetic electronic excitation of solids by particle bombardment
Nucl. Instrum. Methods B 269, 1190 (2011)
DOI: 10.1016/j.nimb.2010.12.014
Johannes Hopster, Detlef Diesing, Andreas Wucher and Marika Schleberger  
Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions
MRS Proceedings 1354, mrss11-1354-ii07-12 (2011)
DOI: 10.1557/opl.2011.1083
2010 Peter Thissen, Beate Schindler, Detlef Diesing and Eckart Hasselbrink  
Optical response of metal-insulator-metal heterostructures and their application for the detection of chemicurrents
New. J. Phys. 12, 113014 (2010)
DOI: 10.1088/1367-2630/12/11/113014
D.A. Kovács, A. Golczewski, G. Kowarik, F. Aumayr and D. Diesing  
Low-energy ion-induced electron emission in metal-insulator-metal sandwich structures
Phys. Rev. B 81, 075411 (2010)
DOI: 10.1103/PhysRevB.81.075411
2009 Eckart Hasselbrink  
Non-adiabaticity in surface chemical reactions
Surf. Sci. 603, 1564 (2009)
DOI: 10.1016/j.susc.2008.12.037
Kevin Stella, Damian Bürstel, Steffen Franzka, Oliver Posth and Detlef Diesing  
Preparation and properties of thin amorphous tantalum films formed by small e-beam evaporators
J. Phys. D: Appl. Phys. 42, 135417 (2009)
DOI: 10.1088/0022-3727/42/13/135417
K. Stella, D.A. Kovács and D. Diesing  
Photo-sensitive metal-insulator-semiconductor devices with stepped insulating layer
Electrochem. Solid State Lett. 12, H453 (2009)
DOI: 10.1149/1.3242215
2007 Eckart Hasselbrink  
How non-adabatic are surface dynamical processes?
Curr. Opin. Solid State Mater. Sci. 10, 192-204 (2006)
DOI: 10.1016/j.cossms.2007.04.003
Kevin Stella and Detlef Diesing  
The field dependence of aging processes
J. Electrochem. Soc. 154, C663 (2007)
DOI: 10.1149/1.2779969
2006 Y. Jeliazova, M. Kayser, B. Mildner, A. W. Hassel and D. Diesing  
Temperature stability of thin anodic oxide films in metal/insulator/metal structures: A comparison between tantalum and aluminium oxide
Thin Solid Films 500, 330-335 (2006)
DOI: 10.1016/j.tsf.2005.10.088
Beate Mildner, Eckart Hasselbrink and Detlef Diesing  
Electronic excitations induced by surface reactions of H and D on gold
Chem. Phys. Lett. 432, 133-138 (2006)
DOI: 10.1016/j.cplett.2006.10.048
2004 A. Thon, M. Merschdorf, W. Pfeiffer, T. Klamroth, P. Saalfrank and D. Diesing  
Photon-assisted tunneling versus tunneling of excited electrons in metal–insulator–metal junctions
Appl. Phys. A 78, 189–199 (2004)
DOI: 10.1007/s00339-003-2314-2
D. Diesing, M. Merschdorf, A. Thon and W. Pfeiffer  
Identification of multiphoton induced photocurrents in metal–insulator–metal junctions
Appl. Phys. B 78, 443–446 (2004)
DOI: 10.1007/s00340-003-1391-4
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